Browse Standards
IEEE Draft Standard for a Smart Transducer Interface for Sensors, Actuators, and Devices - Message Queue Telemetry Transport (MQTT) for Networked Device Communication
This standard defines a method for transporting IEEE 1451 messages over a network using Message Queue Telemetry Transport (MQTT) to establish a light-weight, simplified protocol structure to handle IEEE 1451 communications, and this standar...
IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Network Capable Application Processor Information Model
This standard defines an object model with a network-neutral interface for connecting processors to communication networks, sensors, and actuators. The object model containing blocks, services, and components specifies interactions with sen...
IEEE Standard for a Smart Transducer Interface for Sensors and Actuators--Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) Formats
The common functions, network services, transducer services, and Transducer Electronic Data Sheet (TEDS) formats for members of the IEEE 1451 family of standards to be interoperable in both network interface and transducer interface are pro...
Approved IEEE Draft Standard for a Smart Transducer Interface for Sensors and Actuators Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) Formats
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an SoC flow, the smaller design embedded in t...
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification
IEEE Std 1450™-1999, which specifies the Standard Test Interface Language (STIL), is extended by this standard to provide an interface between test generation tools and test equipment with regard to the specification of the flow of executi...
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
The STIL environment supports transferring tester-independent test programs to a specific automated testing equipment (ATE) system. Although native STIL data are tester independent, the actual process of mapping the test program onto tester...
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
Define structures in STIL for specifying the DC conditions for a device under test. Examples of the DC conditions for device power supplies are: device power supply setup, power sequencing to the device, power supply limit
IEEE Approved Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the la...
IEEE Guide for the Measurement of Partial Discharges in AC Electric Machinery
A review of the nature of partial discharge in machine windings, how it can be measured under both off-line and on-line conditions, how it can be measured for individual form wound coils or bars, and the significance and limitations of the ...