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This paper discusses educational tools, resources and experience in teaching physics-of-failure (PoF) modeling and data analysis methods used in accelerated life testing (ALT) and accelerated degradation testing (ADT). The concepts introduc...

For every semiconductor device, digital processor, FPGA (field programmable gate array), etc. on a typical electronics board, there are usually a dozen or more associated MLCCs. They perform power supply bypassing, DC isolation, EMI filteri...

In the current IT landscape, key challenges are to "un the business", "Outperform competition" & to expand the customer base to "Grow the business". This mandates an organization to constantly diversify the existing services provided and ad...

Conformal coatings have been used to protect the electronic assemblies from corrosive gases, dust, and moisture. In recent years, conformal coatings have been relied on to mitigate the electrical shorting risk presented by tin mitigation, a...

Due to the Restriction of Hazardous Substances by European legislation, Lead free solders such as SAC305 have replaced the use of lead in the commercial electronic industry. Lead free (LF) solder joints, having lower ductility, often are th...

Mission assurance requires due diligence reliability for space systems taking into account limited accessibility, high uncertainty on the life data and high cost of failure. The methods based on physics of failure are promising approaches f...

If the focus during product development is on estimating a failure distribution function or a lifetime-quantile, analysis of failure behavior or determination of optimal design alternatives, there is often no alternative to life tests until...

Power cycling is a testing method for power semiconductor devices wherein switching functions are simulated to generate heat and raise junction temperature instead of using a chamber. Failure analysis of devices following the test can provi...

A significant increase in HASS testing demand drove the necessity for process improvement to reduce traditional set-up times. Multiple part numbers are undergoing HASS testing at the manufacturing facility. With limited resources and capaci...

Environmental stress screening (ESS) is a process to eliminate defects caused by materials and manufacturing variations in electronic products by a 100% screening, with the goal to eventually improve manufacturing processes that cause the d...