Browse Conferences
Probabilistic reliability evaluation of space system considering physics of fatigue failure
Mission assurance requires due diligence reliability for space systems taking into account limited accessibility, high uncertainty on the life data and high cost of failure. The methods based on physics of failure are promising approaches f...
Planning of reliability life tests within the accuracy, time and cost triangle
If the focus during product development is on estimating a failure distribution function or a lifetime-quantile, analysis of failure behavior or determination of optimal design alternatives, there is often no alternative to life tests until...
Impact of dormancy periods on power cycling of insulated gate bipolar transistors (IGBTS)
Power cycling is a testing method for power semiconductor devices wherein switching functions are simulated to generate heat and raise junction temperature instead of using a chamber. Failure analysis of devices following the test can provi...
HASS Rapid Change-Over Process
A significant increase in HASS testing demand drove the necessity for process improvement to reduce traditional set-up times. Multiple part numbers are undergoing HASS testing at the manufacturing facility. With limited resources and capaci...
Critical review of U.S. Military environmental stress screening (ESS) handbook
Environmental stress screening (ESS) is a process to eliminate defects caused by materials and manufacturing variations in electronic products by a 100% screening, with the goal to eventually improve manufacturing processes that cause the d...
Cover glass behavior in handheld device drop: modeling; validation and design evaluation
Cover glass reliability performance in a drop test is critical for handheld electronic devices. Handheld device drop test has limitations in measuring dynamic response on the device components which complicates the test control and data ana...
Challenges in setting up and analyzing a multi-stress accelerated test
Planning a viable Multi-stress Accelerated Test can be a good challenge. It should start with the objective of the accelerated test being identified. It might be to estimate life, identify the main failure modes or mechanisms, or perhaps th...
An accelerated on-wafer test to improve long-term reliability of a 0.25 μm PHEMT process
Performance walkout is a phenomenon observed in AlGaAs/GaAs PHEMTs (Pseudomorphic High Electron Mobility transistors) which can adversely affect the long term reliability of devices that have applications in power amplifier design [5]. Temp...
Accelerated stress & reliability testing for software and cyber-physical systems
This paper considers the topic of accelerated testing of cyber-physical systems and software. It compares the testing of these systems to each other and to classical mechanical/electro-mechanical systems. The impact of the software (and com...
Accelerated life testing of a commercial door handle
This paper describes the test methodology, execution, and analysis of an accelerated life test (ALT) of a commercial door handle design (Fig. 1.). ALT is used to force failures to occur in less time by applying increased stresses to the com...