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- Computing and Processing
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Fatima Adly
Also published under:
Affiliation
ECE Department, Ohio State University, Columbus, OH, USA
Advanced Technology Investment Company (ATIC)-Khalifa Semiconductor Research Center, Khalifa University, Abu Dhabi, United Arab Emirates
Advanced Technology Investment Company (ATIC)-Khalifa Semiconductor Research Center, Khalifa University, Abu Dhabi, United Arab Emirates
Topic
Generalized Regression Neural Network,Identification Of Patterns,Patterning Defects,Self-organizing Map,Semiconductor Industry,Semiconductor Wafer,Support Vector Machine,Wafer Maps,Artificial Neural Network,General Regression,Machine Learning Models,Machine Learning Techniques,Multilayer Perceptron,Number Of Learners,Over-fitting Problem,Probabilistic Neural Network,Radial Basis Function,Random Technique,Repetitive Patterns,Sequential Minimal Optimization,Support Vector Machine Model,Time Complexity,Artificial Neural Network Techniques,Bayesian Classifier,Chemical Staining,Classification Decision,Cluster Centers,Clustering Patterns,Data Partitioning,Decision Tree,Error Probability,Fabrication Process,Generalization Ability,Generalization Ability Of The Model,Global Defects,Homogeneous Poisson Process,Identification Problem,Industrial Engineering,Kinds Of Defects,Learning Algorithms,Learning Network,Manufacturing Process,Means Algorithm,Network Model,Neural Network,Powerful Technique,Probabilistic Model,Random Generation,Random Subset,Receiver Operating Characteristic Curve,
Biography
Fatima Adly received the B.Sc. degree in communications engineering from the ATIC-Khalifa Semiconductor Research Center, Khalifa University, Abu Dhabi, in 2013, where she is currently pursuing the M.Sc. degree. She is currently working on a research project focusing on identifying and classifying defect patterns in semiconductor wafer maps supported by ICT Fund and Samsung Electronics.