David Galipeau

Also published under:D. Galipeau, David W. Galipeau, D. W. Galipeau

Affiliation

Department of Electrical Engineering and Computer Science, South Dakota State University (SDSU), South Dakota, USA

Topic

Solar Cells,Atomic Force Microscopy,Indium Tin Oxide,Active Layer,Back Reflector,Efficiency Of Solar Cells,Fill Factor,Isopropanol,Light Traps,Organic Solar Cells,Phase Separation,Photovoltaic System,Short-circuit Current Density,Spin-coated,Substrate Temperature,Thin Films,Thin-film Solar Cells,AFM Images,Absorption Edge,Acetone,Airbrush,Al Film,Ammonium Fluoride,Amorphous Silicon,Angle Distribution,Argon Gas,Array Size,Atomic Force Microscopy Analysis,Atomic Force Microscopy Data,Atomic Force Microscopy Images,Average Angle,Average Grain,Average Grain Size,Average Hours,Average Peak,Band Gap,Blend Solution,Body Height,Bottom Cell,Cell Quality,Cell Voltage,Chamber Pressure,Changes In Frequency,Changes In Radiation,Characteristics Of Films,Charge Transport,Chemical Vapor Deposition,Chlorobenzene,Coated Glass Substrates,Coatings,

Biography

David W. Galipeau (M'91) received the Ph.D. degree from The University of Maine, Orono, in 1992.
He is currently the Harold C. Hohbach Professor and Graduate Coordinator of electrical engineering with South Dakota State University, Brookings.