Mowafak Al-Jassim

Solar Cells,Perovskite Solar Cells,Contact Resistance,Cycling,Electrical Contact,Irreversible Degradation,Kelvin Probe Force Microscopy,Photoluminescence Imaging,Photovoltaic Modules,Silicon Solar Cells,Ag Particles,Atomic Force Microscopy,Atomic Force Microscopy Images,Bathocuproine,Conductive Pathways,Contact Point,Degradation Mechanism,Device Performance,Electric Field Strength,Electrical Bias,High Resistance,Indium Tin Oxide,Ionizing Radiation,Kelvin Probe,Kelvin Probe Force,Line Profiles,Local Resistance,Open Circuit,Output Feature,Peak Electric Field,Perimeter Area,Perovskite Devices,Series Resistance,Series Resistance Rs,Short-circuit Current,Solar Power Plants,polySia,4H-SiC MOSFETs,Absorber Layer,Activation Energy,Amount Of Generation,Arrhenius Plot,Band Offset,Band States,Bias Voltage,Blocking Voltage,Body Diode,Capture Cross Section,Capture Rate,Cause Of Degradation,