Keith Y. K. Leung

Also published under:Keith Yu Kit Leung, Keith Leung

Affiliation

Applanix Corporation (Trimble), Richmond Hill, ON L4B 3B3, Canada

Topic

Simultaneous Localization And Mapping,Posterior Mode,Detection Probability,Random Vector,Robot Trajectory,Bayesian Estimation,Bayesian Filtering,False Alarm,Feature Maps,Optimal Assignment,Spatial Error,Target Tracking,Trajectory Estimation,Conditional Probability Density Function,Empty Set,Error Map,Filtration Performance,Ground Truth Map,Hausdorff Distance,Ideal Conditions,Intuitive Manner,Localization Error,Mahalanobis Distance,Mapping Problem,Navigation Problem,Non-ideal Conditions,Number Of Landmarks,Physical Interpretation,Poisson Distribution,Probability Density Function,Random Finite Set,Single Feature,Spatial Uncertainty,Tree Trunks,Unit Distance,Vehicle Trajectory,Amplitude Information,Autonomic System,Benchmark For Comparison,Continuous Work,Control Input,Cutoff Parameter,Density Map,Descriptive Characteristics,Divergence Estimates,Elements In Order,Error Detection,Error Metrics,Estimate Of The Number,Estimation Problem,

Biography

Keith Leung (M’06) received the B.A.Sc. degree in 2005 and the M.A.Sc. degree in 2007 from University of Waterloo, Waterloo, ON, Canada, in mechanical engineering. He received the Ph.D. degree in 2012 from University of Toronto, Toronto, ON, Canada.
He was a member of the Autonomous Space Robotics Laboratory and the Flight Systems Control Laboratory, Institute for Aerospace Studies. From 2012 to 2016, he was a Postdoctoral Researcher with the Advanced Mining Technology Center and Department of Electrical Engineering, Universidad de Chile. His area of expertise is in state estimation and robot navigation, as well as simultaneous localization and mapping. He is currently a vision processing, perception, and robotics expert with Applanix (Trimble) Richmond Hill, ON, Canada.