Amin Emrani

Also published under:A. Emrani

Affiliation

Research and Advanced Engineering, Ford Motor Company, Palo Alto, CA, USA

Topic

Digital Signal Processing,Electric Vehicles,Hurst Exponent,Sudden Changes,Data Filtering,Dc Arc Fault,Detection Methods,Detection Time,Electrode,Hardware Test,Hybrid Electric Vehicles,Load Changes,Switching Noise,Test Setup,Time Window,White Noise,Analog Filter,Analog-to-digital Converter,Arc Fault,Average Value,Brownian Motion,Chaotic System,Copper Electrodes,Current Envelope,Current Sensor,Dc Microgrid,Electrode Diameter,Event Detection,Fast Fourier Transform,Filtering Process,Filtering Stage,Filtering Step,Frequency Spectrum,Frequency-based Methods,High Frequency Noise,Instantaneous Amplitude,Learning Algorithms,Length Of The Time Window,Line Current,Load Transients,Lower Cut-off Frequency,Noise Sources,Online Detection,Power Line,Precision And Recall,Precision Metrics,Printed Circuit Board,Pure Electric,Random Signal,Recall Metrics,

Biography

Amin Emrani (Member, IEEE) was born in Isfahan, Iran, in 1985. He received the B.S. and M.S. degrees in electrical engineering from the Isfahan University of Technology, Isfahan, in 2007 and 2010, respectively, and the Ph.D. degree from Binghamton University, Binghamton, NY, USA, in 2014.
He has several years of experience in various areas from machine learning, data science, and image processing to power electronics and solid-state fabrication. He has work experience with Fortune 100, start-up companies, and academia, including R&D positions with Ford Motor Company, Palo Alto, CA, USA, and Cornell University, Ithaca, NY. Throughout his professional career, he has been leading, conducting, and contributing to several interdisciplinary research projects, which led to more than 26 technical publications and patents, which have been cited more than 290 times.