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Babak Arfaei
Also published under:B. Arfaei
Affiliation
Research and Advanced Engineering, Ford Motor Company, Palo Alto, CA, USA
Topic
Digital Signal Processing,Electric Vehicles,Electrode,Hurst Exponent,Sudden Changes,White Noise,Aging Time,Analog Filter,Analog-to-digital Converter,Arc Fault,Brownian Motion,Chaotic System,Concentration Of Agent,Copper Pillars,Crack Propagation,Current Sensor,Data Filtering,Dc Arc Fault,Detection Methods,Detection Time,Ductile Failure,Effect Of Process Variables,Electrode Diameter,Electron Micrographs,Eutectic Phase,Event Detection,Fast Fourier Transform,Filtering Stage,Formation Of Intermetallic Compounds,Hardware Test,High Frequency Noise,Hybrid Electric Vehicles,Intermetallic,Joint Geometry,Larger Length Scales,Lead-free,Learning Algorithms,Length Scale,Line Current,Load Changes,Load Transients,Lower Cut-off Frequency,Microns In Diameter,Microstructure,Monotonic Increase,Noise Sources,Online Detection,Power Line,Precision And Recall,Precision Metrics,
Biography
Babak Arfaei received the Ph.D. degree in materials science and engineering from Binghamton University, Binghamton, NY, USA, in 2010.
He is currently a Materials Scientist with Ford Motor Company, Palo Alto, CA, USA, and also a Research Assistant Professor with the Physics Department, Binghamton University. Prior to Ford, he worked with Universal Co., where he conducted research in the area of reliability of electronic packages. His research interests include, additive manufacturing, 2-D materials, microstructure and texture analysis of metals, nucleation and growth in metallic systems, and thermomechanical behavior of lead-free solder alloys.
Dr. Arfaei is a member of the Technical Committee of Surface Mount Technology Association (SMTA) and the Electronic Packaging and Interconnection Materials Committee of The Minerals, Metals & Materials Society (TMS). He serves as a Technical Advisor for the Journal of the Minerals, Metals, and Materials (JOM) as well as a Reviewer for multiple international publications.
He is currently a Materials Scientist with Ford Motor Company, Palo Alto, CA, USA, and also a Research Assistant Professor with the Physics Department, Binghamton University. Prior to Ford, he worked with Universal Co., where he conducted research in the area of reliability of electronic packages. His research interests include, additive manufacturing, 2-D materials, microstructure and texture analysis of metals, nucleation and growth in metallic systems, and thermomechanical behavior of lead-free solder alloys.
Dr. Arfaei is a member of the Technical Committee of Surface Mount Technology Association (SMTA) and the Electronic Packaging and Interconnection Materials Committee of The Minerals, Metals & Materials Society (TMS). He serves as a Technical Advisor for the Journal of the Minerals, Metals, and Materials (JOM) as well as a Reviewer for multiple international publications.