Topic
- Computing and Processing
- Components, Circuits, Devices and Systems
- Communication, Networking and Broadcast Technologies
- Power, Energy and Industry Applications
- Signal Processing and Analysis
- Robotics and Control Systems
- General Topics for Engineers
- Fields, Waves and Electromagnetics
- Engineered Materials, Dielectrics and Plasmas
- Bioengineering
- Transportation
- Photonics and Electrooptics
- Engineering Profession
- Aerospace
- Geoscience
- Nuclear Engineering
- Career Development
- Emerging Technologies
- Telecommunications
- English for Technical Professionals
J. W. Chan
Also published under:Jer Chan
Affiliation
Imaging Science Group, School of Science & Technology, Nottingham Trent University, Nottingham, UK
Topic
University Team,3D Technology,Angular Distance,Atomic Density,Bragg Angle,Calibration Materials,Circular Objects,Collimator,Color Code,Color Palette,Color Scheme,Comparative Analysis,Copper Sheet,Crystal Grains,Depth Increments,Diffraction Images,Diffraction Intensity,Diffraction Signal,Discrimination Technique,Empirical Results,Energy-dispersive X-ray Diffraction,Experimental Materials,Focal Plane,Focal Spot,Homeland Security,Illumination Changes,Image Acquisition Process,Image Registration,Image Synthesis,Imagery,Increase In Intensity,Large Field Of View,Large Grains,Linear Detection,Linear Discriminant Analysis,Morphing,Narrow Beam,Pixel Error,Preferred Orientation,Relative Gain,Scale-invariant,Scale-invariant Feature Transform,Security Screening,Shape Variation,Sheet Thickness,Significantly Increased,Silicon Nitride,Speeded Up Robust Features,Stepped Wedge,Surface Density,
Biography
Jer ChanWith the financial support of vice chancellor scholarship, Jer Chan graduated from Nottingham Trent University, UK in 2000 with a B. Eng. (Hon) degree. He was awarded departmental prize for his outstanding performance. He then received studentship to pursue the PhD study in the same University and graduated in 2005. Since 2004 till now, he has been working as researcher to investigate various X-ray imaging techniques for security and inspection applications. He is also interested on conducting human factors centered evaluation. He is a member of UK IET.