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Giuseppe Acri
Also published under:G. Acri
Affiliation
Nxp Semiconductors, Toulouse, France
Topic
Attenuation Constant,Return Loss,Insertion Loss,Metal Layer,Substrate Integrated Waveguide,CMOS Process,CMOS Technology,Dielectric Constant,Electrical Performance,Form Factor,Low Loss,Meandering,Measured Insertion Loss,Passive Circuit,Phase Imbalance,Quality Factor,Simulation Results,22nm Technology,Absolute Difference,Absolute Phase,Advanced CMOS Technology,Analysis Equation,Antenna Array,Array Factor,Back-end-of-line,Branch-line Coupler,Center Frequency,Circuit Design,Classical Lineage,Constant Phase,Conventional Matrix,Coplanar Waveguide,Development Of Circuits,EM Simulation,Effective Dielectric Constant,Electrical Length,Electromagnetic Simulation,Feeding Ports,Filter Design,Frequency Band,Frequency Shift,Ground Plane,High Performance,Impact Of Isolation,In-line Filter,Inductive Load,Inner Wall,Insights For Design,Intermediate Layer,Magnetic Field,
Biography
Giuseppe Acri received the B.S. degree in electronics engineering and the M.S. degree in telecommunications engineering from the University of Calabria, Italy, in 2012 and 2016, respectively, and the Ph.D. degree from the RFIC-Laboratory, University of Grenoble Alpes, in 2020. From 2015 to 2016, he did an Internship at the IMEP-LaHC, Grenoble, France, during which he designed slow-wave passive devices in advanced CMOS technology for mm-wave applications. He was involved in design and implementation of passive RF and millimeter-wave components and switched beam array antennas networks with the University of Grenoble Alpes. From 2020 to 2021, his research interest was in design and implementation of passive devices in BCB 3D-packaging technology for sub-THz applications. He worked at Asygn, Grenoble, as RF/mm-Wave Designer. He is currently working at NXP, Toulouse, and a RF/mm-Wave Designer. The focus of his work is on RF Built-In Self Test (BIST) circuitry design in CMOS28nm, for automotive applications.