Tom Ahola

Also published under:T. Ahola, T. E. Ahola

Affiliation

Nokia Research Center, Helsinki, Finland

Topic

YAG Laser,Absolute Frequencies,Absolute Measures,Frequency Stability,International Comparisons,Laser System,National Institute Of Metrology,Noise Intensity,Amplitude Modulation,Body Area Networks,Cold Finger,Data Logger,Design Software,Diode Laser,Excellent Agreement,Excellent Repeatability,Experimental Uncertainties,Frequency Dependence,Frequency Values,Hardware Architecture,Host System,Hyperfine,Laser Performance,Laser Power,Lock-in Amplifier,Measurement Frequency,Measurement Uncertainty,Mobile Phone,Modulation Frequency,Ne Laser,Operating System,Optical Comb,Piezoelectric Actuator,Platform For Applications,Power Consumption,Pressure Cell,Probe Beam,Saturable Absorber,Science And Technology,Second Harmonic Generation,Sensor Platform,Software Applications,Software Architecture,Solid-state Laser,System Performance,Wavelength Of Light,Wireless Sensor,Digital Signal Processing,Iodine Concentration,Laser Frequency,

Biography

T. Ahola, photograph and biography not available at the time of publication.