Christoph Adelmann

Also published under:C. Adelmann, Ch Adelmann

Affiliation

IMEC, Leuven, Belgium

Topic

Grain Boundaries,Spin Waves,Mean Free Path,Point Defects,Thin Films,Atom Probe Tomography,Boolean Logic,Carbon Nanotubes,Complex Circuits,Conceptual Level,Domain Wall,Electrical Domain,Energy Consumption,Film Thickness,Fluctuations In Composition,Grain Size,Magnetic Domain,Physical Vapor Deposition,Si Substrate,Thermal Budget,2D Band,2D Materials,Ab Initio,Ab Initio Calculations,Acoustic Velocity,Acoustic Waves,Advanced Interconnect,Advances In Materials Science,Area Overhead,Atomic Force Microscopy,Atomic Layer Deposition,Barrier Layer,Binary Compounds,Boolean Gating,Bulk Resistance,Carbon Film,Carrier Frequency,Circuit Area,Compressive Stress,Contact Resistance,Continuous Excitation,Continuous Mode Of Operation,Continuous Wave,Critical Conditions,Crystallite,Damping,Defect Density,Electrical Signals,Electromigration,Energy Cost,

Biography

Christoph Adelmann (Member, IEEE) received the Ph.D. degree in condensed matter physics from the Université Grenoble Alpes, Grenoble, France, in 2002, for work at the CEA Grenoble.
Until 2006, he was a Postdoctoral Research Associate with the Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, USA, working on spintronic materials and devices. He subsequently joined IMEC, where he is currently working as the Scientific Director of the Thin Films Group on metallic and dielectric materials for logic, interconnects, and memory, as well as on novel devices for nanoelectronic applications. He is the Technical Lead for magnetoelectric logic at IMEC and has authored or coauthored over 270 scientific publications in peer-reviewed journals and conference proceedings (H-index of 40), as well as ten granted patent families and 18 pending patent applications.