Hiroyuki Fujiki

Also published under:H. Fujiki

Affiliation

Department of Creative Engineering, Muroran Institute of Technology, Muroran, JAPAN

Topic

Alternating Current,Aluminum Nitride,Resistance Change,Resistance Values,Series Circuit,Step-up Procedure,Thermal Conductivity,Thermocouple,Thin-film Resistors,Voltage-gated Channels,Ac Source,Best Linear Fit,Changes In Capacity,Circuit Theory,Close Agreement,DC Voltage,Decrease In Sensitivity,Dendrogram,Dependent Loss,Differences In Resistance,Differential Technique,Dimensional Changes,Dominant Contribution,Electrical Circuit,Engineering Education,Engineering Ethics,Fast Fourier Transform,Fast Fourier Transform Analysis,Frequency Range,Heat Resistance,Impedance Measurements,Impedance Values,Input Power,Input Voltage,Josephson Voltage Standard,Lesson Content,Measured Frequency Range,National Average,National Institute Of Metrology,Negligible Dependence,Open Squares,Output Impedance,Parallel Circuit,Policy Research,Power Coefficient,Printed Circuit Board,Resistant Varieties,Root Mean Square Amplitude,Root Mean Square Values,Science And Technology,

Biography

Hiroyuki Fujiki was born in Fukuoka, Japan, in 1968. He received the Ph.D. degree from Kyushu University, Fukuoka, in 1998.
Since 1999, he has been with the National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan. He is currently involved in ac–dc transfer standards. He is the Chief of the Applied Electrical Standards Group of the NMIJ since 2013.
Dr. Fujiki is a member of the Physical Society of Japan and the Institute of Electrical Engineers.