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Louay Abdallah
Also published under:L. Abdallah
Affiliation
Robert Bosch, Stuttgart, Baden-Württemberg, Germany
Topic
Gain Stage,Low-noise Amplifier,Training Set,Validation Set,Alternative Measures,Alternative Test,Feed-forward Network,Noise Figure,Power Amplifier,Radio Frequency Devices,Regression Equation,Root Mean Square Error,Temperature Sensor,Test Stimuli,Accuracy Metrics,Age Prediction,Alternative Paradigm,Alternative Patterns,Amplitude Of Component,Bit Error Rate,Built-in Self-test,Built-in Sensors,Center Frequency,Class Of Sensors,Conventional Procedures,Cost Function,Current Mirror,DC Bias,Design Space,Device Performance,Differential Sensor,Digital Multimeter,Error Vector Magnitude,External Resources,Fast Fourier Transform,Figure Of Merit,Fraction Of The Cost,Gate Electrode,Hardware Overhead,Homodyne,Hot Electrons,Instances In Set,Integrated Circuit,Joule Effect,Large Volumes Of Data,Learning Procedure,Linear Range,Loop Parameters,Low Cost,Low-cost Test,
Biography
Louay Abdallah is pursuing a PhD in microelectronics at TIMA Laboratory in Grenoble, France. His research focuses on DFT of RF circuits and systems. He has an MSc in micro-and nanoelectronics from the University of Joseph Fourier, Grenoble, France. He is a student member of IEEE.