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Narendra Kumar
Also published under:
Affiliation
Samtel Centre for Display Technologies, Materials Science Programme, IIT Kanpur, Kanpur, India
Topic
Sensitivity Of The Device,pH Sensitivity,pH Values,Active Layer,Amplification Factor,Analytical Devices,Annealed Films,Annealing Temperature,Ar Plasma,Atmospheric Oxygen,Backchannel,Binding Site Model,Bottom Gate,Capacitance Values,Capacitive Coupling,Contact Resistance,Crystallite,Decrease In pH Value,Device Fabrication,Device Stability,Dielectric Constant,Dielectric Layer,Dielectric Surface,Double Layer,Dual Operation,Electrical Characteristics,Electrode,Electrode Materials,Field-effect Transistors,Gate Capacitance,Gold Nanoparticles,Hexamethyldisilazane,High Contact Resistance,High Temperature,High-temperature Annealing,Hysteresis,Impedance Analysis,Maximum Sensitivity,Nernst Limit,Particle Size,Particles Of Different Sizes,Physical Modification,Polyamidoamine,Polyethylene Terephthalate,Porous Silicon,Post-deposition Annealing,Pseudo-reference Electrode,Pulsed Laser Deposition,Rare Earth Elements,Sensitivity Enhancement,
Biography
Narendra Kumar received the master’s degree in laser science and applications from Devi Ahilya University, Indore, India. He is currently a Research Scholar of the Materials Science Program at the Indian Institute of Technology Kanpur, Kanpur, India. His research interest is to study the role of nanotextured dielectrics and their surface modifications in EIS systems.