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Philippe Besnier
Also published under:P. Besnier, Philippes Besnier
Affiliation
Univ Rennes, INSA Rennes, CNRS, CentraleSupélec, Nantes Université, IETR UMR, France
Topic
Reverberation Chamber,Frequency Range,Vector Network Analyzer,Anechoic Chamber,Function Of Frequency,Reflection Coefficient,Horn Antenna,Radar Cross Section,Transmission Coefficient,Alternative Models,Aperture,Backscattering Coefficient,Electromagnetic Field,GHz Frequency Range,Measurement Setup,Printed Circuit Board,Radiation Pattern,Antenna Array,Antenna Radiation Pattern,Azimuth Angle,Computation Time,Contact Resistance,Correlation Function,Cumulative Contribution,Dynamic Range,Dynamic Range Of Measurements,Electromagnetic Shielding,Enclosure,Experimental Design,Faraday Cage,Frequency Band,Frequency Bandwidth,Gaussian Process,Input Space,Input Variables,Insertion Loss,Iterative Learning,Kriging,Loading Conditions,Magnetometer,Median Error,Metal Plate,Multiple-input Multiple-output,Non-invasive Method,Optical Sensors,PIN Diodes,Pellucida,Prediction Error,Radiation Mode,Rare Events,
Biography
Philippe Besnier (Senior Member, IEEE) received the diplôme d’ingénieur degree from école universitaire d’ingénieurs de Lillle (EUDIL), Lille, France, in 1990, and the Ph.D. degree in electronics from the University of Lille, Lille, in 1993.
He was with ONERA, Meudon as an Assistant Scientist in the EMC Division. He was with the Laboratory of Radio-Propagation and Electronics (LRPE), University of Lille, as a Researcher (chargé de recherche) with the Center National de la Recherche Scientifique (C.N.R.S.) from 1994 to 1997. From 1997 to 2002, he was the Director of the Center d’Etudes et de Recherches en Protection Electromagnétique (CERPEM): a non-for-profit organization for research, expertise, and training in EMC and related activities, based in Laval, France. He also co-founded TEKCEM, in 1998, a small business company specialized in turn-key systems for EMC measurements. In CNRS, in 2002, he has been since then with the Institut d’Electronique et des Technologies du numéRique (IETR), Rennes, France. He was appointed as a CNRS Senior Researcher (directeur de recherche au CNRS) in 2013. He was the Co-Head of the Antennas and Microwave Devices Research Department, IETR, from 2012 to 2016. He headed the WAVES (electromagnetic waves in complex media) Team during the first semester of 2017. Since July 2017, he has been the Deputy Director of the IETR. His research activities deal with interference analysis on cable harnesses (including electromagnetic topology), theory and application of reverberation chambers, shielding and absorbing techniques, near-field probing, and uncertainty quantification in EMC modeling.
He was with ONERA, Meudon as an Assistant Scientist in the EMC Division. He was with the Laboratory of Radio-Propagation and Electronics (LRPE), University of Lille, as a Researcher (chargé de recherche) with the Center National de la Recherche Scientifique (C.N.R.S.) from 1994 to 1997. From 1997 to 2002, he was the Director of the Center d’Etudes et de Recherches en Protection Electromagnétique (CERPEM): a non-for-profit organization for research, expertise, and training in EMC and related activities, based in Laval, France. He also co-founded TEKCEM, in 1998, a small business company specialized in turn-key systems for EMC measurements. In CNRS, in 2002, he has been since then with the Institut d’Electronique et des Technologies du numéRique (IETR), Rennes, France. He was appointed as a CNRS Senior Researcher (directeur de recherche au CNRS) in 2013. He was the Co-Head of the Antennas and Microwave Devices Research Department, IETR, from 2012 to 2016. He headed the WAVES (electromagnetic waves in complex media) Team during the first semester of 2017. Since July 2017, he has been the Deputy Director of the IETR. His research activities deal with interference analysis on cable harnesses (including electromagnetic topology), theory and application of reverberation chambers, shielding and absorbing techniques, near-field probing, and uncertainty quantification in EMC modeling.