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Bryan Ackland
Also published under:B. Ackland, B. D. Ackland
Affiliation
Department of Electrical and Computer Engineering, Stevens Institute of Technology
Topic
Dark Current,Image Sensor,Quantum Efficiency,Shortwave Infrared,Acoustic,Ambiguity Function,Analog Output,Aperture,Array Images,Band Gap,Bell Labs,Blackbody,Broadband Response,CMOS Process,CMOS Technology,Camera Operator,Communication Systems,Dark Noise,Depletion Region,Dielectric Surface,Digital Architecture,Digital Domain,Digital Signal,Digital Signal Processing,Direct Gap,Epitaxial,Fill Factor,Flicker Noise,High-volume Production,IEEE Transactions,Illumination,Image Chips,Large Switching,Microlenses,Night Images,Night Sky,Night Vision,Passive Imaging,Photodiode,Pixel Array,Power Meter,Shortwave Infrared Images,Signal Processing,Silicon Wafer,Small Band Gap,Speech Processing,Technology Management,Technology Transfer,Thermal Budget,Thermal Expansion,
Biography
Bryan Ackland ([email protected]) is a distinguished service professor in the Department of Electrical and Computer Engineering at Stevens Institute of Technology, New Jersey. He received the B.Sc. degree in physics from Flinders University, Australia, in 1972 and the B.E. and Ph.D. degrees in electrical engineering from the University of Adelaide, Australia, in 1975 and 1979, respectively. In 1978, he joined Bell Laboratories as a member of technical staff in the Image Processing and Display Research Department. In 1986 he was appointed director of DSP and VLSI Systems Research in Holmdel, New Jersey. In 2001, he became vice president of Circuits and Systems Research at Agere Systems. In 2004 he joined NoblePeak Vision as vice president of Engineering. He has for many years been heavily involved in the IEEE Solid State Circuits Society and the Council on Electronic Design Automation. He is a member of the Executive Committee of the International Solid-State Circuits Conference and has been a general chair of the Design Automation Conference. He holds 24 U.S. patents and is the author of over 60 refereed technical publications. He is a Fellow of the IEEE and Bell Laboratories.